GATE 2019: ECE Test Series Schedule
Electronics and Communication Engineering ( GATE – EC )
Test Name

Number of Test

Topicwise Test

20

Subjectwise Test

10

Full Subject Test

10

Total Number of Test

40

A. Topicwise Tests – Two Half Test in a Subject
Each test carries 30 Marks and consists of 20 Questions. The duration of the test will be 60 Minutes.
Type of question 
Number of question 
1 Mark Question 
10 
2 Marks Question 
10 
Total Number of Questions 
20 
Subject: 1. Network Theory
Subject 
Test Syllabus 
01. 
Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton’s, maximum power transfer; Wye‐Delta transformation. 
02. 
Steady state sinusoidal analysis using phasors; Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain analysis of RLC circuits; Linear 2‐port network parameters: driving point and transfer functions; State equations for networks. 
Subject: 2. Signals and Systems
Subject 
Test Syllabus 
03. 
Continuoustime signals: Fourier series and Fourier transform representations, sampling theorem and applications; Discretetime signals: discretetime Fourier transform (DTFT), DFT, FFT, Ztransform, interpolation of discretetime signals. 
04. 
LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay, digital filter design techniques. 
Subject: 3. Electronic Devices
Subject 
Test Syllabus 
05. 
Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; PN junction, Zener diode, BJT 
06. 
MOS capacitor, MOSFET, LED, photo diode and solar cell; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twintub CMOS process. 
Subject: 4. Analog Circuits
Subject 
Test Syllabus 
07. 
Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Singlestage BJT and MOSFET amplifiers: biasing, bias stability, midfrequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multistage. 
08. 
Differential, feedback, power and operational; Simple opamp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, singletransistor and op amp configurations; Function generators, waveshaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. 
Subject: 5. Digital Circuits
Test No. 
Test Syllabus 
09. 
Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip‐flops, counters, shift‐registers and finite state machines. 
10. 
Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM; 8bit microprocessor (8085): architecture, programming, memory and I/O interfacing. 
Subject: 6. Control Systems
Test No. 
Test Syllabus 
11. 
Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steadystate analysis of LTI systems; Frequency response; RouthHurwitz and Nyquist stability criteria. 
12. 
Bode and rootlocus plots; Lag, lead and laglead compensation; State variable model and solution of state equation of LTI systems. 
Subject: 7. Communications
Test No. 
Test Syllabus 
13. 
Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications; Information theory: entropy, mutual information and channel capacity theorem. 
14. 
Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, intersymbol interference and its mitigation; Basics of TDMA, FDMA and CDMA. 
Subject: 8. Electromagnetics
Test No. 
Test Syllabus 
15. 
Electrostatics; Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth 
16. 
Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, Sparameters, Smith chart; Waveguides: modes, boundary conditions, cutoff frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers. 
Subject: 9. Engineering Mathematics
Test No. 
Test Syllabus 
17. 
Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigen values and eigen vectors, rank, solution of linear equations – existence and uniqueness.
Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series.
Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy’s and Euler’s equations, methods of solution using variation of parameters, complementary function and particular integral, partial differential equations, variable separable method, initial and boundary value problems.

18. 
Vector Analysis: Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss’s, Green’s and Stoke’s theorems.
Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula; Taylor’s and Laurent’s series, residue theorem.
Numerical Methods: Solution of nonlinear equations, single and multistep methods for differential equations, convergence criteria.
Probability and Statistics: Mean, median, mode and standard deviation; combinatorial probability, probability distribution functions – binomial, Poisson, exponential and normal; Joint and conditional probability; Correlation and regression analysis.

Subject: 10. General Aptitude
Test No. 
Test Syllabus 
19. 
Verbal Ability: English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction. 
20. 
Numerical Ability: Numerical computation, numerical estimation, numerical reasoning and data interpretation. 
B. Subjectwise Test
Each test carries 50 Marks and consists of 30 Questions. The duration of the test will be 90 Minutes.
Type of question 
Number of question 
1 Mark Question 
10 
2 Marks Question 
20 
Total Number of Questions 
30 
Test No. 
Test subject 
21. 
Network Theory 
22. 
Signals and systems 
23. 
Electronic Devices 
24. 
Analog Circuits 
25. 
Digital Circuits 
26. 
Control Systems 
27. 
Communications 
28. 
Electromagnetics 
29. 
Engineering Mathematics 
30. 
General Aptitude 
C. Full Test – Grand GATE Test Series
Each test carries 100 Marks and consists of 65 Questions. The duration of the test will be 180 Minutes.
Test No. 
Test subject 
31. 
GATE – 01 
32. 
GATE – 02 
33. 
GATE – 03 
34. 
GATE – 04 
35. 
GATE – 05 
36. 
GATE – 06 
37. 
GATE – 07 
38. 
GATE – 08 
41. 
GATE – 09 
40. 
GATE – 10 
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