Electronics and Comm. Engg Test Series Schedule – GATE + IES(ESE) 2018

Electronics and Comm. Engg Test Series Schedule – GATE + IES(ESE)

Note: Do not worry about the test you left due to late registration, All the previous test series will also be provided to the new registered GATE Aspirants.

Test Name Number of Test
Topic-wise Test 20
Subject-wise Test 10
Full ESE Test 4
Full GATE Test 5
Total Number of Test 46

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A. Topic-wise Tests – Two Half Test in a subject

Each test carries 20 Marks and consists of 13 Questions. The duration of the test will be 45 Minutes.

           Type of question             Number of question
1 Mark Question 6
2 Marks Question 7
Total Number of Questions 13

Subject: 1. Networks

Subject Test syllabus Date of Activation
01. Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton’s, maximum power transfer; Wye‐Delta transformation. 08/07/2017
02. Steady state sinusoidal analysis using phasors; Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain analysis of RLC circuits; Linear 2‐port network parameters: driving point and transfer functions; State equations for networks. 11/07/2017

Subject : 2. Signals and Systems

Subject Test syllabus Date of Activation
03. Continuous-time signals: Fourier series and Fourier transform representations, sampling theorem and applications; Discrete-time signals: discrete-time Fourier transform (DTFT), DFT, FFT, Z-transform, interpolation of discrete-time signals. 14/07/2017
04. LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay, digital filter design techniques. 19/07/2017

Subject: 3. Electronic Devices

Subject Test syllabus Date of Activation
05. Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode, BJT 25/07/2017
06. MOS capacitor, MOSFET, LED, photo diode and solar cell; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process. 28/07/2017

Subject: 4. Analog Circuits

Subject Test syllabus Date of Activation
07. Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage. 31/07/2017
08. Differential, feedback, power and operational; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. 03/07/2017

Subject: 5. Digital Circuits

Test No. Test syllabus Date of Activation
09. Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs; Sequential circuits: latches and flip‐flops, counters, shift‐registers and finite state machines. 06/08/2017
10. Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. 09/08/2017

Subject: 6. Control Systems

Test No. Test syllabus Date of Activation
11. Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Frequency response; Routh-Hurwitz and Nyquist stability criteria. 12/08/2017
12. Bode and root-locus plots; Lag, lead and lag-lead compensation; State variable model and solution of state equation of LTI systems. 15/08/2017

Subject: 7. Communications

Test No. Test syllabus Date of Activation
13. Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems; Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, super heterodyne receivers, circuits for analog communications; Information theory: entropy, mutual information and channel capacity theorem. 18/08/2017
14. Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, inter-symbol interference and its mitigation; Basics of TDMA, FDMA and CDMA. 21/08/2017

Subject: 8. Electromagnetics

Test No. Test syllabus Date of Activation
15. Electrostatics; Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth 24/08/2017
16. Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers. 27/08/2017

Subject: 9. Engineering Mathematics

Test No. Test syllabus Date of Activation
17.

Linear Algebra: Vector space, basis, linear dependence and independence, matrix algebra, eigen values and eigen vectors, rank, solution of linear equations – existence and uniqueness.

Calculus: Mean value theorems, theorems of integral calculus, evaluation of definite and improper integrals, partial derivatives, maxima and minima, multiple integrals, line, surface and volume integrals, Taylor series.

Differential Equations: First order equations (linear and nonlinear), higher order linear differential equations, Cauchy’s and Euler’s equations, methods of solution using variation of parameters, complementary function and particular integral, partial differential equations, variable separable method, initial and boundary value problems.

30/08/2017
18.

Vector Analysis: Vectors in plane and space, vector operations, gradient, divergence and curl, Gauss’s, Green’s and Stoke’s theorems.

Complex Analysis: Analytic functions, Cauchy’s integral theorem, Cauchy’s integral formula; Taylor’s and Laurent’s series, residue theorem.

Numerical Methods: Solution of nonlinear equations, single and multi-step methods for differential equations, convergence criteria.

Probability and Statistics: Mean, median, mode and standard deviation; combinatorial probability, probability distribution functions – binomial, Poisson, exponential and normal; Joint and conditional probability; Correlation and regression analysis.

03/09/2017

Subject : 10. General Aptitude

Test No. Test syllabus Date of Activation
19. Verbal Ability: English grammar, sentence completion, verbal analogies, word groups, instructions, critical reasoning and verbal deduction. 06/09/2017
20. Numerical Ability: Numerical computation, numerical estimation, numerical reasoning and data interpretation. 09/09/2017

                                                 

B. Subjectwise Test

Each test carries 50 Marks and consists of 30 Questions. The duration of the test will be 90 Minutes.

           Type of question             Number of question
1 Mark Question 10
2 Marks Question 20
Total Number of Questions 30
Test No. Test subject Date of activation
21. Networks 16/09/2017
22. Signals and systems 23/09/2017
23. Electronic Devices 30/09/2017
24. Analog Circuits 7/10/2017
25. Digital Circuits 14/10/2017
26. Control Systems 21/10/2017
27. Communications 28/10/2017
28. Electromagnetics 4/11/2017
29. Engineering Mathematics 11/11/2017
30. General Aptitude 18/11/2017
31. Basic Electrical Engineering 21/11/2017
32. Materials Science 24/11/2017
33. Electronic Measurements and Instrumentation 26/11/2017
34. Computer Organization and Architecture 28/11/2017
35. Advanced Electronics Topics: 30/11/2017
36. Advanced Communication Topics 01/12/2017
37. Electro Magnetics: 04/12/2017

 C. Full Test – GATE & IES (ESE) Grand Test

1. Full ESE(IES) Test

Each test carries 300 Marks and consists of 150 Questions. The duration of the test will be 180 Minutes.

Test No. Test subject Date of Activation
38. ESE – 1 2/12/2017
39. ESE – 2 9/12/2017
40. ESE – 3 16/12/2017
41. ESE – 4 23/12/2017

2. Full GATE Test

Each test carries 100 Marks and consists of 65 Questions. The duration of the test will be 180 Minutes.

Test No. Test subject Date of Activation
42. GATE -1 2/12/2017
43. GATE -2 9/12/2017
44. GATE -3 16/12/2017
45. GATE -4 23/12/2017
46. GATE -5 30/12/2017

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